PROBABILISTIC MODELS OF HARDRE RELIABILITY AND DATA INTEGRITY IN CYBER-PHYSICAL SYSTEMS

Ю. С. Манжос, Є. В. Соколова

Abstract


The article investigates the reliability of cyber-physical systems (CPS), focusing on hardware failures and their propagation into software and physical processes. The main sources of failures in computation, memory, communication, power supply, and sensing subsystems are analyzed, accounting for the influence of external factors such as radiation, electromagnetic interference, and thermal stress. The mechanisms of single-event upsets (SEU), multi-bit upsets (MBU), and burst errors are examined. The study analyzes error-amplification mechanisms in software algorithms and feedback loops. Formal dependencies for estimating the rate of dangerous undetected failures are introduced. It is shown that memory and data transmission subsystems are critical to ensuring CPS reliability, and that integrated hardware-software protection methods are essential for functional safety. Probabilistic memory failure models are proposed that account for both independent and correlated errors, as well as aging effects. Formal dependencies for evaluating the intensity of dangerous undetected failures, taking diagnostic coverage into account, are established. Special attention is paid to the mechanisms of error propagation and amplification through software implementations of algorithms, feedback loops, and state retention, which are characteristic features of cyber-physical systems. The necessity of applying integrated hardware-software protection methods and utilizing simulation to improve reliability and ensure the functional safety of cyber-physical systems is substantiated.


Keywords


cyber-physical systems; reliability; memory; failures; functional safety.

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DOI: https://doi.org/10.32620/oikit.2026.108.14

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